In this contribution a simple thermodynamic limit is found for digital electronic circuits. It is found
that for very small dimensions of the order 0.1 m, the number of active charge carriers is so small
that the fault probability is no longer negligible. As will be pointed out, a very small number of
charge carriers requires a thermodynamical analysis of the conduction phenomena. Due to the large
number of transistors in a single chip, the statistical behaviour becomes dominant.