@inproceedings{M091.034,
author={Vanden Berghe R and Demolder, S. and Saille, M. and Allaert, K. and De Bruycker, A. and Van Calster, A. and Capon, J. and De Baets, J. and De Rycke, I. and De Smet, H. and Doutreloigne, J. and Vanfleteren, J.},
title={Failure Mechanisms in Dielectrics},
booktitle={Proceedings of the 8th European Hybrid Microelectronics Conference},
year={1993},
month={5},
pages={157-164},
publisher={ISHM},
}