@inproceedings{P096.097,
author={Stroobandt, D. and Van Campenhout, J.},
title={Hierarhical Test Generation with Built-in Fault Diagnosis},
booktitle={Proceedings of the Fifth Asian Test Symposium},
year={1996},
month={11},
pages={22-28},
editor={Kavanaugh, M.E.},
publisher={IEEE Computer Society Press},
address={Los Alamitos, California},
}