@inproceedings{P102.092, author={De Pauw, H. and De Baets, J. and Vanfleteren, J. and Van Calster, A.}, title={An O/E measurement probe based on an optics-extended MCM-D motherboard technology}, booktitle={Proceedings of the 35th International Symposium on Microelectronics (IMAPS)}, year={2002}, month={9}, pages={936-941}, address={Denver, Colorado}, }