@inproceedings{P102.092,
author={De Pauw, H. and De Baets, J. and Vanfleteren, J. and Van Calster, A.},
title={An O/E measurement probe based on an optics-extended MCM-D motherboard technology},
booktitle={Proceedings of the 35th International Symposium on Microelectronics (IMAPS)},
year={2002},
month={9},
pages={936-941},
address={Denver, Colorado},
}