@inproceedings{P108.158,
author={Janicki, Marcin and Kinderman, Stefan and Pietrzak, Piotr and Vermeersch, Bjorn and Banaszczyk, Jedrzej and De Mey, Gilbert and Napieralski, Andrzej},
title={Determining thermal simulation data from transient measurements},
booktitle={Proceedings of the 24th IEEE Annual Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM 24)},
year={2008},
month={3},
volume={24},
pages={198-202},
}