@inproceedings{P110.231,
author={Nair, Arun Arvind and John, Lizy Kurian and Eeckhout, Lieven},
title={AVF stressmark : towards an automated methodology for bounding the worst-case vulnerability to soft errors},
booktitle={MICRO-43 : proceedings of the 43rd Annual IEEE/ACM international symposium on microarchitecture},
year={2010},
pages={125-136},
publisher={IEEE Computer Society},
address={Los Alamitos, CA, USA},
}