@article{P113.068,
author={Jablonski, Michal and Bossuyt, Frederick and Vanfleteren, Jan and Vervust, Thomas and de Vries, Hans},
title={Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor},
journal={MICROELECTRONICS RELIABILITY},
year={2013},
volume={53},
number={7},
pages={956-963},
}