@article{P113.068, author={Jablonski, Michal and Bossuyt, Frederick and Vanfleteren, Jan and Vervust, Thomas and de Vries, Hans}, title={Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor}, journal={MICROELECTRONICS RELIABILITY}, year={2013}, volume={53}, number={7}, pages={956-963}, }